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SEE (Single Event Effect) tests on GLAST TKR front-end electronics in 2001.
Test chip "top5" for GLAST TKR front-end electronics
3 power lines: AVDD (2.5 V), AVDD2 (1.5 V), and DVDD (2.5 V).
3 channels of a preamp, a shaper, and a comparator for TKR
powered by AVDD and AVDD2.
1 preamp for CAL powered by AVDD and AVDD2
A 128-bit shit register powered by DVDD;
4 blocks of 32-bit registers, each of which is designed differently:
3 SEU-resistive registers and a non-resistive one.
(Schematic drawing of a shift-register on "top5")
Find SEU threshold in laser power for each design of a shift-register.
Find SEL threshold in laser power for each design of a shift-register.
LabVIEW VI's: This ZIPped file (224 kB)
includes a main VI "see2001_nrl.vi" (640 kB),
and two sub VI's "open_logfile.vi" (59 kB)
and "decode_pod1.vi" (35 kB).
Put all three in one directory and open "see2001_nrl.vi" to use it.
Worked on LabVIEW 5.1.
LabVIEW VI's: This ZIPped file (280 kB)
includes a main VI "see2001_lnl.vi" (682 kB),
and four sub VI's "open_logfile.vi" (59 kB),
"decode_pod1.vi" (35 kB),
"check_counter.vi" (40 kB),
and "fill_histogram.vi" (26 kB).
Put all three in one directory and open "see2001_lnl.vi" to use it.
Worked on LabVIEW 5.1.