Wafer test in fall 2002


Wafer layout

Test results

No. Wafer ID gtfe64g gtfe64f
Current draw*1,
Trigger rate of channel #8*2
Current draw*1,
Trigger rate of all channel OR*3
Functionality
test*4
Current draw*1,
Trigger rate of channel #8*2
Current draw*1,
Trigger rate of all channel OR*3
Functionality
test*4
W00 D2K05221KOE6 text data --- text data text data --- text data
W01 D2K04167KOE4 text data --- text data text data --- text data
W02 D2K10317KOD7 text data --- text data text data --- text data
W03 D2K07136KOL5 text data --- text data text data --- text data
W04 D2K09060KOH0 text data --- text data text data --- text data
W05 D2K08066KOC5 text data --- text data text data --- text data
W06 D2K09150KOB5 text data --- text data text data --- text data
W07 D2K09253KOG1 text data text data text data text data text data text data
W08 D2K10195KOD5 text data text data text data text data text data text data
W09 D2K04258KOD3 text data text data text data text data text data text data
W10 D2K05144KOF2 text data text data text data text data text data text data
W11 D2K05350KOF6 text data text data text data text data text data text data
W12 D2K07315KOC3 text data text data text data text data text data text data
W13 D2K08211KOB3 text data text data text data text data text data text data
W14 D2K09095KOE7 text data text data text data text data text data text data
W15 D2K09159KOD0 text data text data text data text data text data text data
W16 D2K10016KOC3 text data text data text data text data text data text data

Test setups


sugizaki@scipp.ucsc.edu
Last modified: Mon Jan 13 22:37:13 PST 2003