Minutes of the Tracker Electronics Meeting 
November 13, 2000

Present: Robert, David, Dieter, Ned, Hartmut, and Wilko


1.	GTFE Schematic: Robert stated that he has nearly finished
the schematic. He was concerned about the reset circuit using the two clock
sources. After some discussion, a decision was made to go back to the
original circuit with a simple pull down resistor internal to the GTFE.
Robert also stated the he still needs to clean up the schematic. Robert will
compile the chip digital simulation to make sure everything is OK. David will also start
looking at the design once Robert has it ready.  Robert stated he is worried
about the amount of work left to lay out the chip. The differential
drivers/receivers, DACs and chip simulation have not been worked on yet. We
also are using only one voltage so we no longer need level translators.
Dieter will work on the DACs once Wilko will define the DAC requirements
this week. Wilko wants the DAC's resolution set such that noise scans are easier.
Changing the resolution and range will be easy, but changing the design to
7-bit linear would require much more layout work.

2.	Schematic checking: Dieter stated he is worried about
substrate nets being properly handled. The concern is that substrates are
not simulated and LVS may have that net turned off since substrates are
generally tied to GND or VDD. Dieter stated he is working on the low voltage
differential clock, command & triggers drivers and receivers. Ned stated he
thinks 25mV-50mV is workable from his experience.

3.	MCM design: David stated that he has the MCM schematic
completed and the PADs layout ready for routing. He stated he wants Sergei
to start placement so we find any problems early.
 
4.	GTRC design;  Jeff: David stated that Jeff has completed the "final"
documentation on the GTRC. He wants people to read and comment.

5.	Schedule: David stated that he needs to finish the
electronics schedule with Thomas and Robert. David will get together with Thomas then
meet with Robert at Santa Cruz on Thursday.

6.	MCM testing:  Wilko stated he is working on the noise
measurement of the MCM. He stated he has removed all the bypassing
capacitors for 17 GTFE chips and measured a 5% increase in noise. Wilko
stated he would remove all the capacitors, make another noise measurement
and then load the smaller capacitors that are required for space
qualification. Hartmut asked if Wilko's noise measurement accuracy of 3% is
valid. Wilko stated it is very repeatable.