SN 259 Post-BurnIn summary


SN
259
Status
Post-BurnIn
Test Result
Pass
Operator
Mutsumi
TE_Config
002
Software_V
rel-1-3-4
Reference MCM S/N
New06
Location
SLAC
GTRC version
7
Board type
Short(898)
Start Time
2004/05/22 19:27:42
End Time
2004/05/22 19:44:42
Dead or Hot channels
[]
Bad Gain or Noise channels
[]

Power Consumption and LVDS levels

Functionality

Bias leakage current (TM703)

Bias_V (V) Bias_I (nA)
2.0 0.6907
4.0 1.2889
6.0 1.6257
8.0 1.8168
10.0 2.2151
15.0 4.4073
20.0 5.7219
Bias_V (V) Bias_I (nA)
30.0 11.5238
40.0 14.6804
50.0 16.4746
60.0 18.6766
70.0 20.7067
80.0 21.5165
90.0 22.7443
Bias_V (V) Bias_I (nA)
100.0 23.3292
110.0 23.8331
120.0 24.3358
130.0 24.6710
140.0 24.9171
150.0 25.3024
160.0 25.8347
Bias_V (V) Bias_I (nA)
170.0 26.7379
180.0 27.2495
190.0 27.9196
200.0 30.0627

Threshold scan without charge injection (TM710)

Gain and Noise (TM714)

Noise trigger rate threshold scan (TM715)