SN 262 Post-BurnIn summary

SN: 262
Status: Post-BurnIn
Test Result: Pass
Operator: mutsumi
TE_Config: 002
Software_V: rel-1-3-4
Reference MCM S/N: new_06
Location: SLAC
GTRC version: 7
Board type: Short(898)
Start Time: 2004/07/01 16:15:41
End Time: 2004/07/01 16:16:59
Dead or Hot channels: []
Bad Gain or Noise channels: []

Power Consumption and LVDS levels

Connector saver : Both
- TM702: Power consumption
- TM708: LVDS levels
Connector saver : LEFT only
- TM702: Power consumption
- TM708: LVDS levels
Connector saver : RIGHT only
- TM702: Power consumption
- TM708: LVDS levels

Functionality

14MHz
20MHz
22MHz
LEFT
RIGHT

Bias leakage current (TM703)

Bias_V (V)	Bias_I (nA)
2.0	0.1741
4.0	1.1405
6.0	1.3325
8.0	2.1308
10.0	2.5309
15.0	5.0295
20.0	6.7208

Bias_V (V)	Bias_I (nA)
30.0	15.0883
40.0	19.5876
50.0	22.9994
60.0	26.4694
70.0	29.6477
80.0	32.3528
90.0	34.4362

Bias_V (V)	Bias_I (nA)
100.0	36.6197
110.0	38.4925
120.0	40.4950
130.0	42.2234
140.0	44.0275
150.0	44.8370
160.0	46.5672

Bias_V (V)	Bias_I (nA)
170.0	48.4684
180.0	50.5762
190.0	53.6390
200.0	56.6262

Threshold scan without charge injection (TM710)

Gain and Noise (TM714)

Gain
Noise

Noise trigger rate threshold scan (TM715)