SN 303 Post-BurnIn summary

SN: 303
Status: Post-BurnIn
Test Result: Pass
Operator: mutsumi
TE_Config: 002
Software_V: rel-1-3-4
Reference MCM S/N: new_06
Location: SLAC
GTRC version: 7
Board type: Short(898)
Start Time: 2004/07/01 16:09:49
End Time: 2004/07/01 16:11:07
Dead or Hot channels: []
Bad Gain or Noise channels: []

Power Consumption and LVDS levels

Connector saver : Both
- TM702: Power consumption
- TM708: LVDS levels
Connector saver : LEFT only
- TM702: Power consumption
- TM708: LVDS levels
Connector saver : RIGHT only
- TM702: Power consumption
- TM708: LVDS levels

Functionality

14MHz
20MHz
22MHz
LEFT
RIGHT

Bias leakage current (TM703)

Bias_V (V)	Bias_I (nA)
2.0	0.2109
4.0	0.9887
6.0	1.4909
8.0	2.1105
10.0	2.5848
15.0	5.1397
20.0	6.7837

Bias_V (V)	Bias_I (nA)
30.0	15.5881
40.0	19.6345
50.0	23.6613
60.0	26.0601
70.0	29.8825
80.0	32.1670
90.0	34.8377

Bias_V (V)	Bias_I (nA)
100.0	37.1441
110.0	38.7458
120.0	40.3959
130.0	41.8839
140.0	43.7627
150.0	44.7952
160.0	46.5086

Bias_V (V)	Bias_I (nA)
170.0	48.1084
180.0	49.9876
190.0	53.4499
200.0	56.6206

Threshold scan without charge injection (TM710)

Gain and Noise (TM714)

Gain
Noise

Noise trigger rate threshold scan (TM715)