SN 237 Post-BurnIn summary


SN
237
Status
Post-BurnIn
Test Result
Pass
Operator
Mutsumi
TE_Config
002
Software_V
rel-1-3-4_and_rel-2-0-1
Reference MCM S/N
New06
Location
SLAC
GTRC version
7
Board type
Tall(899)
Start Time
2004/11/15 09:51:51
End Time
2004/11/15 10:00:20
Dead or Hot channels
[]
Bad Gain or Noise channels
[]
Bad trigger channels
No Data
Number of bad response channels
0
Disconnected pitch-adapter channels
[]
Number of disconnected pitch-adapter channels
0
Number of bad channels in total
0

Power Consumption and LVDS levels

Functionality

Bias leakage current (TM703)

Bias_V (V) Bias_I (nA)
2.0 0.5148
4.0 1.2419
6.0 1.6964
8.0 2.1298
10.0 2.4146
15.0 4.5459
20.0 5.7057
Bias_V (V) Bias_I (nA)
30.0 11.9705
40.0 14.7703
50.0 17.4600
60.0 19.5587
70.0 21.3484
80.0 22.5408
90.0 23.9999
Bias_V (V) Bias_I (nA)
100.0 23.8756
110.0 24.9337
120.0 26.4736
130.0 26.2143
140.0 26.3218
150.0 24.7815
160.0 27.0292
Bias_V (V) Bias_I (nA)
170.0 27.6540
180.0 28.1985
190.0 29.4009
200.0 31.3209

Threshold scan without charge injection (TM710)

Gain and Noise (TM714)

Noise trigger rate threshold scan (TM715)

TREQ response (TM713)

Pitch adapter signal channel connection

Pitch adapter bias connection