SN 259 Post-BurnIn summary


SN
259
Status
Post-BurnIn
Test Result
Pass
Operator
Mutsumi
TE_Config
002
Software_V
rel-1-3-4
Reference MCM S/N
New06
Location
SLAC
GTRC version
7
Board type
Short(898)
Start Time
2004/05/22 19:27:42
End Time
2004/05/22 19:44:42
Dead or Hot channels
[]
Bad Gain or Noise channels
[]
Bad trigger channels
No Data
Number of bad response channels
0
Disconnected pitch-adapter channels
No Data
Number of disconnected pitch-adapter channels
No Data
Number of bad channels in total
0

Power Consumption and LVDS levels

Functionality

Bias leakage current (TM703)

Bias_V (V) Bias_I (nA)
2.0 0.6907
4.0 1.2889
6.0 1.6257
8.0 1.8168
10.0 2.2151
15.0 4.4073
20.0 5.7219
Bias_V (V) Bias_I (nA)
30.0 11.5238
40.0 14.6804
50.0 16.4746
60.0 18.6766
70.0 20.7067
80.0 21.5165
90.0 22.7443
Bias_V (V) Bias_I (nA)
100.0 23.3292
110.0 23.8331
120.0 24.3358
130.0 24.6710
140.0 24.9171
150.0 25.3024
160.0 25.8347
Bias_V (V) Bias_I (nA)
170.0 26.7379
180.0 27.2495
190.0 27.9196
200.0 30.0627

Threshold scan without charge injection (TM710)

Gain and Noise (TM714)

Noise trigger rate threshold scan (TM715)

TREQ response (TM713)

Pitch adapter signal channel connection

Pitch adapter bias connection