SN176 test summary

SN

176.0

Status

Final

TE_Config

1.0

Operator

Mutsumi

Start Time

12/18/03 11:40:03

End Time

12/18/03 12:09:30

Power Consumption and LVDS levels

• TM702: Power consumption


• TM708: LVDS levels

Functionality

• 14MHz
• 20MHz
• 22MHz

Bias leakage current (TM703)

Gain and Noise (TM714)

• Gain
  
• Noise