Calibration for the KEK Beamtest in February 95





Author: Riko Wichmann
This page was created July 13, 1995, last modified January 31, 1996

Introduction

The calibration was performed by fitting s-curves (integral of an error function) onto the efficiency as a function of threshold extracting their meadian value and the sigma. These fits were done for all channels and all chips for different calibration voltages which are related to a certain charge injected to the channels. The median value of these s-curves plotted versus the injected charge then gives us the response function of each channel which we fitted using a 3 parameter function.
These parameters m1, m2 and m3 give us the calibration of the detector system, meaning a relationship between the threshold voltage of the amplifier chip and the charge on the amplifier input. From the so obtained fitting parameters we can already calculate the small signal gain and and the noise of the detectors.

Characterization of the Runs

The calibration was performed for the three groups of threshold scans using the whole range of injected charges (0.75 fC - 5 fC). Here the runs will be labeled by the run number of the smallest charge:
run708
contains results of run number 708 to 716
57 ns delay optimized for n-side timing
detector board NOT yet in beam position
bias voltage + 50 V and - 50 V
run723
contains results of run number 717 - 725
same timing as in run708 (n-side timing)
detector boards moved to beam position
bias voltage + 50 V and - 50 V
run726
contains results of run number 726 - 734
35 ns delay optimized for p-side timing
same bias voltage as before
The hits per event were determined by oring two timeslices.
Here we present some results for board 0.

General Results

Average Calibration Parameters

The following table gives the average of the response curve parameters over channels 10 to 54 (to exclude effects of the side) which were bonded to the chip. The separation of bonded and non-bonded channels was performed by a cut on the noise (bonding map).
run   chip#  |    m_1  |    m_2  |   m_3   | Remark
-----------------------------------------------------------------------------------------
723:   0     |  32.49  |  159.2  |  563.7  | averaged over channel 10 - 54
             |  40.55  |  157.4  |  548.6  | 4 strips ganged
             |  37.22  |  158.2  |  570.3  | 3 strips ganged
             |  37.15  |  160.9  |  559.4  | 2 strips ganged
             |  38.91  |  156.7  |  567.6  | alternating bonded/non-bonded LBIC channels
       1     |  47.22  |  161.0  |  560.3  | all channels bonded
       2     |  51.15  |  149.5  |  719.1  | 2 strips ganged
       3     |  44.68  |  149.2  |  697.9  | all channels bonded
-------------------------------------------------------------------------------------------
726:   0     |  37.38  |  160.4  |  524.7  | averaged over channel 10 - 54
             |  40.70  |  158.0  |  503.9  | 4 strips ganged
             |  36.38  |  161.9  |  538.4  | 3 strips ganged
             |  37.65  |  159.4  |  516.0  | 2 strips ganged
             |  37.12  |  162.5  |  535.4  | alternating bonded/non-bonded LBIC channels
       1     |  44.67  |  167.8  |  524.0  | all channels bonded
       2     |  50.01  |  152.0  |  718.5  | 2 strips ganged
       3     |  42.87  |  152.4  |  679.5  | all channels bonded

Some Plots displaying the Results

Here are some postscript plots illustrating the above stated results:

Conclusion

Complete Calibration Data

The complete calibration data for all 15 chips can be downloaded as gzip'ed tar-files from my directory /pub/wichmann/kek_feb95 on the scipp ftp server (use anonymous ftp if not using the above link).


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