Detector Measurements

Author: Wilko
This page was created December 1, 1995, last modified October 29, 1996

Index

  1. Interstrip Capacitance
    1. Method of Measurement
    2. C-V curves for ATLAS nn 80AC Detector
    3. C-V curves for a 75µm n-strip, n-type detector (ATLAS)
  2. Body Capacitance
    1. Method of Measurement
    2. CV curve for ATT7 and UCSC2
  3. Measurements with a Ru-source
    1. efficiency of irradiated double sided silicon microstrip detectors using the Ru-source
  4. Calibration of Detectors
    1. results from KEK beamtest in June 1994
    2. results from KEK beamtest in February 1995
  5. Irradiation Test of Silicon Detectors
    1. Irradiation Test (July 96) (10^15 mips/cm^2)

Ru-source measurements

Activity of the Ru-source.

In august 1995 the activity was dropped by 2.5x10e-4, corresponding to 1200 decays / sec.

Detector Calibration

To perform a calibration, a known charge is injected into the front end electronics. For a range of threshold values the efficiency of the detector and electronic is measured. The efficiency versus the threshold is then fitted with a s-curve (complimentary error function) to extract the median (50 % point of efficiency) and the sigma (with represents the noise). These values are calculated for several input charges. The response of the detector board can then be obtained by fitting the median value vs the injected charge with a response function to relate the threshold (in mV) to a detector signal (collected charge in fC).
A more detailed description of this method can be found here.
Calibrations were performed at double sided silicon detectors at two beam test at KEK - the results are available on this server:

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