GTFE/GTRC Wafer Test
Test plans
GTFE wafer test plan: LAT-TD-00247 in the
GLAST document archive
GTRC wafer test plan: LAT-TD-00248 in the
GLAST document archive
Test system
Test system description: LAT-TD-00153 in the
GLAST document archive
Pin assignment: support board + GTFE probe card (
PDF
,
PostScript
)
Pin assignment: support board + GTRC probe card (
PDF
,
PostScript
)
Drawings of the probe cards and the support board
Probe card for GTFE (October 2001)
schematics (
PDF
,
PostScript
), top layer (
PDF
,
PostScript
), part list (
ASCII
), pin-assignment (
PDF
,
PostScript
)
Probe card for GTRC (October 2001)
schematics (
PDF
,
PostScript
), top layer (
PDF
,
PostScript
), bottom layer (
PDF
,
PostScript
), part list (
ASCII
), pin-assignment (
PDF
,
PostScript
), block diagram (
PDF
,
PostScript
), GTRC pad layout (
PDF
)
Support board for GTFE/GTRC probe cards (December 2001)
schematics (
PDF
,
PostScript
), top layer (
PDF
,
PostScript
), part list (
ASCII
), block diagram (
PDF
,
PostScript
),
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Masaharu Hirayama
Last modified: Thu Mar 7 16:25:23 PST 2002
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